Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD)

Franco Stellari, Peilin Song. Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD). Microelectronics Reliability, 44(9-11):1663-1668, 2004. [doi]

Abstract

Abstract is missing.