A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs - researchr publication authors

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Luca Sterpone, Ludovica Bozzoli, Corrado De Sio, Boyang Du, Sarah Azimi. A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs. In 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2019, Lausanne, Switzerland, July 15-18, 2019. pages 205-208, IEEE, 2019. [doi]

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