Igor S. Stievano, Luca Rigazio, Flavio G. Canavero, Telmo Reis Cunha, José C. Pedro, Hugo M. Teixeira, Antonio Girardi, Roberto Izzi, Filippo Vitale. Behavioral Modeling of IC Memories From Measured Data. IEEE T. Instrumentation and Measurement, 60(10):3471-3479, 2011. [doi]
Abstract is missing.