A Novel Metric for XAI Evaluation Incorporating Pixel Analysis and Distance Measurement

Jan Stodt, Christoph Reich, Nathan L. Clarke. A Novel Metric for XAI Evaluation Incorporating Pixel Analysis and Distance Measurement. In 35th IEEE International Conference on Tools with Artificial Intelligence, ICTAI 2023, Atlanta, GA, USA, November 6-8, 2023. pages 1-9, IEEE, 2023. [doi]

@inproceedings{StodtRC23,
  title = {A Novel Metric for XAI Evaluation Incorporating Pixel Analysis and Distance Measurement},
  author = {Jan Stodt and Christoph Reich and Nathan L. Clarke},
  year = {2023},
  doi = {10.1109/ICTAI59109.2023.00009},
  url = {https://doi.org/10.1109/ICTAI59109.2023.00009},
  researchr = {https://researchr.org/publication/StodtRC23},
  cites = {0},
  citedby = {0},
  pages = {1-9},
  booktitle = {35th IEEE International Conference on Tools with Artificial Intelligence, ICTAI 2023, Atlanta, GA, USA, November 6-8, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-4273-4},
}