A Novel Metric for XAI Evaluation Incorporating Pixel Analysis and Distance Measurement

Jan Stodt, Christoph Reich, Nathan L. Clarke. A Novel Metric for XAI Evaluation Incorporating Pixel Analysis and Distance Measurement. In 35th IEEE International Conference on Tools with Artificial Intelligence, ICTAI 2023, Atlanta, GA, USA, November 6-8, 2023. pages 1-9, IEEE, 2023. [doi]

Abstract

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