Mile K. Stojcev. Semiconductor Memories: Technologies, Testing and Reliability; Ashok K. Sharma. IEEE Press and Wiley Interscience, New York, 1997. Hardcover, pp 462, plus XII, ISBN 0-7803-1000-4. Microelectronics Reliability, 43(3):515, 2003. [doi]
@article{Stojcev03b,
title = {Semiconductor Memories: Technologies, Testing and Reliability; Ashok K. Sharma. IEEE Press and Wiley Interscience, New York, 1997. Hardcover, pp 462, plus XII, ISBN 0-7803-1000-4},
author = {Mile K. Stojcev},
year = {2003},
doi = {10.1016/S0026-2714(03)00002-7},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00002-7},
tags = {testing, reliability},
researchr = {https://researchr.org/publication/Stojcev03b},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {3},
pages = {515},
}