Mile K. Stojcev. High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test; R. Dean Adams, Kluwer Academic Publishers, Boston, 2003, Hardcover, pp 247, plus XIII, ISBN 1-4020-7255-4. Microelectronics Reliability, 43(5):819, 2003. [doi]
@article{Stojcev03d,
title = {High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test; R. Dean Adams, Kluwer Academic Publishers, Boston, 2003, Hardcover, pp 247, plus XIII, ISBN 1-4020-7255-4},
author = {Mile K. Stojcev},
year = {2003},
doi = {10.1016/S0026-2714(03)00056-8},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00056-8},
tags = {modeling, testing, principles, design},
researchr = {https://researchr.org/publication/Stojcev03d},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {5},
pages = {819},
}