The following publications are possibly variants of this publication:
- Rohit Kapur, CTL for Test Information of Digital ICs Hardcover. Kluwer Academic Publisher, Boston, 2003. pp 173, plus XI, ISBN 1-4020-7293-7Mile K. Stojcev. mr, 43(7):1171-1172, 2003. [doi]
- Gregory A. Matson, Tony R. Taylor, Julie N. Villar, Elements of STIL: Principles and Applications of IEEE Std. 1450, Kluwer Academic Publishers, Boston, 2003, Hardcover, pp 291, plus XIX, ISBN 1-4020-7637-1Mile K. Stojcev. mr, 45(12):1951-1952, 2005. [doi]
- Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Said Hamdioui, Kluwer Academic Publishers, Boston, 2004, Hardcover, pp 221, plus XX, ISBN 1-4020-7752-1Mile K. Stojcev. mr, 45(5-6):1012-1013, 2005. [doi]
- Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 178, plus XI, ISBN 1-4020-7235-XMile K. Stojcev. mr, 44(3):547-548, 2004. [doi]
- A designer s guide to built-in self-test; Charles E. Stround. Kluwer Academic Publishers, Boston, 2002. Hardcover, pp 319, plus XVI, ISBN 1-4020-7050-0Mile K. Stojcev. mr, 43(3):514-515, 2003. [doi]
- Analog Design for CMOS VLSI Systems: Franco Maloberti (Ed.); Kluwer Academic Publishers, Dordrecht, 2001, 374 pages, plus XIII, hardcover, ISBN 0-7923-7550-5Mile K. Stojcev. mj, 34(2):161, 2003. [doi]
- Design criteria for low distortion in feedback OPAMP circuits; Bjornar Hernes, Trond Saether, Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 160, plus XXV, ISBN 1-4020-7356-9Mile K. Stojcev. mr, 44(1):181-182, 2004. [doi]
- System Design with System C; Thorsten Grotker, Stan Liao, Grant Martin, Stuart Swan. Kluwer Academic Publishers, Boston, 2002. Hardcover, pp 217, plus X, ISBN 1-4020-7027-1Mile K. Stojcev. mr, 43(4):683-684, 2003. [doi]
- Memory Design Techniques for Low Energy Embedded Systems; Alberto Macii, Luca Benini, Massimo Poncino. Kluwer Academic Publishers, Boston, USA, 2002. Hard cover, pp 144 plus XI, ISBN 0-7923-7690-0Mile K. Stojcev. mr, 43(3):513, 2003. [doi]
- System-on-a-Chip: Design and Test: Rochit Rajsuman (Ed.); Artech House, Boston, 2000, 277 pages, plus XIII, Hardcover, ISBN 1-58053-107-5, GBP61.00Mile K. Stojcev. mj, 34(4):313-314, 2003. [doi]
- Networks on Chip; Axel Jantsch, Hannu Tenhunen (Eds.). Kluwer Academic Publishers, Boston; 2003. Hardcover, pp 303, plus VIII, ISBN 1-4020-7392-5Mile K. Stojcev. mr, 44(7):1203-1204, 2004. [doi]
- Interconnecting and Computing over Satellite Networks; Yongguang Zhang (Ed.). Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 262, plus XXII, ISBN 1-4020-7424-7Mile K. Stojcev. mr, 44(2):363-364, 2004. [doi]
- Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian, Embedded Processor-Based Self Test , Kluwer Academic Publishers, Dordrecht (2004) ISBN 1-4020-2785-0 217 pp., Hardcover, plus XVMile K. Stojcev. mr, 48(4):657-658, 2008. [doi]
- Alfredo Benso, Paolo Prinetto, editors, Fault injection techniques and tools for embedded systems reliability and evaluation, Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 241, plus XIV, ISBN 1-4020-7589-8Mile K. Stojcev. mr, 46(8):1396-1397, 2006. [doi]