Milos Stojmenovic, Amiya Nayak. Measuring the Related Properties of Linearity and Elongation of Point Sets. In José Ruiz-Shulcloper, Walter G. Kropatsch, editors, Progress in Pattern Recognition, Image Analysis and Applications, 13th Iberoamerican Congress on Pattern Recognition, CIARP 2008, Havana, Cuba, September 9-12, 2008. Proceedings. Volume 5197 of Lecture Notes in Computer Science, pages 102-111, Springer, 2008. [doi]
Abstract is missing.