Fault tolerance and reliability in field-programmable gate arrays

Edward A. Stott, N. Pete Sedcole, Peter Y. K. Cheung. Fault tolerance and reliability in field-programmable gate arrays. IET Computers & Digital Techniques, 4(3):196-210, 2010. [doi]

Authors

Edward A. Stott

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N. Pete Sedcole

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Peter Y. K. Cheung

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