Edward A. Stott, N. Pete Sedcole, Peter Y. K. Cheung. Fault tolerance and reliability in field-programmable gate arrays. IET Computers & Digital Techniques, 4(3):196-210, 2010. [doi]
@article{StottSC10,
title = {Fault tolerance and reliability in field-programmable gate arrays},
author = {Edward A. Stott and N. Pete Sedcole and Peter Y. K. Cheung},
year = {2010},
doi = {10.1049/iet-cdt.2009.0011},
url = {http://dx.doi.org/10.1049/iet-cdt.2009.0011},
tags = {reliability},
researchr = {https://researchr.org/publication/StottSC10},
cites = {0},
citedby = {0},
journal = {IET Computers & Digital Techniques},
volume = {4},
number = {3},
pages = {196-210},
}