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Innovative Test Solutions for Pin-Limited Microcontrollers

Matthew G. Stout, Kenneth P. Tumin. Innovative Test Solutions for Pin-Limited Microcontrollers. In 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. pages 437-440, IEEE Computer Society, 2008. [doi]

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Matthew G. Stout

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Kenneth P. Tumin

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