Matthew G. Stout, Kenneth P. Tumin. Innovative Test Solutions for Pin-Limited Microcontrollers. In 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. pages 437-440, IEEE Computer Society, 2008. [doi]
@inproceedings{StoutT08,
title = {Innovative Test Solutions for Pin-Limited Microcontrollers},
author = {Matthew G. Stout and Kenneth P. Tumin},
year = {2008},
doi = {10.1109/ISQED.2008.84},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.84},
tags = {testing},
researchr = {https://researchr.org/publication/StoutT08},
cites = {0},
citedby = {0},
pages = {437-440},
booktitle = {9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3117-5},
}