Alessandro Strano, Davide Bertozzi, Arnaud Grasset, Sami Yehia. Exploiting structural redundancy of SIMD accelerators for their built-in self-testing/diagnosis and reconfiguration. In Joseph R. Cavallaro, Milos D. Ercegovac, Frank Hannig, Paolo Ienne, Earl E. Swartzlander Jr., Alexandre F. Tenca, editors, 22nd IEEE International Conference on Application-specific Systems, Architectures and Processors, ASAP 2011, Santa Monica, CA, USA, Sept. 11-14, 2011. pages 141-148, IEEE, 2011. [doi]
Abstract is missing.