An Analog Checker with Dynamically Adjustable Error Threshold for Fully Differential Circuits - researchr publication authors

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Haralampos-G. D. Stratigopoulos, Yiorgos Makris. An Analog Checker with Dynamically Adjustable Error Threshold for Fully Differential Circuits. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 209-218, IEEE Computer Society, 2003. [doi]

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