Haralampos-G. D. Stratigopoulos, Christian Streitwieser. Adaptive Test With Test Escape Estimation for Mixed-Signal ICs. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(10):2125-2138, 2018. [doi]
@article{StratigopoulosS18,
title = {Adaptive Test With Test Escape Estimation for Mixed-Signal ICs},
author = {Haralampos-G. D. Stratigopoulos and Christian Streitwieser},
year = {2018},
doi = {10.1109/TCAD.2017.2783302},
url = {https://doi.org/10.1109/TCAD.2017.2783302},
researchr = {https://researchr.org/publication/StratigopoulosS18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {37},
number = {10},
pages = {2125-2138},
}