Radoslav Strba, Daniela Bordencea. Defects Recognition on Wafer Maps Using Multilayer Feed-Forward Neural Network. In Marina Tropmann-Frick, Bernhard Thalheim, Hannu Jaakkola, Yasushi Kiyoki, Naofumi Yoshida, editors, Information Modelling and Knowledge Bases XXXII - Proceedings of the 30th International Conference on Information Modelling and Knowledge Bases, EJC 2020, Virtual Event / Hamburg, Germany, June 8-9, 2020. Volume 333 of Frontiers in Artificial Intelligence and Applications, pages 174-186, IOS Press, 2020. [doi]
@inproceedings{StrbaB20, title = {Defects Recognition on Wafer Maps Using Multilayer Feed-Forward Neural Network}, author = {Radoslav Strba and Daniela Bordencea}, year = {2020}, doi = {10.3233/FAIA200828}, url = {https://doi.org/10.3233/FAIA200828}, researchr = {https://researchr.org/publication/StrbaB20}, cites = {0}, citedby = {0}, pages = {174-186}, booktitle = {Information Modelling and Knowledge Bases XXXII - Proceedings of the 30th International Conference on Information Modelling and Knowledge Bases, EJC 2020, Virtual Event / Hamburg, Germany, June 8-9, 2020}, editor = {Marina Tropmann-Frick and Bernhard Thalheim and Hannu Jaakkola and Yasushi Kiyoki and Naofumi Yoshida}, volume = {333}, series = {Frontiers in Artificial Intelligence and Applications}, publisher = {IOS Press}, isbn = {978-1-64368-141-2}, }