Radoslav Strba, Daniela Bordencea. Defects Recognition on Wafer Maps Using Multilayer Feed-Forward Neural Network. In Marina Tropmann-Frick, Bernhard Thalheim, Hannu Jaakkola, Yasushi Kiyoki, Naofumi Yoshida, editors, Information Modelling and Knowledge Bases XXXII - Proceedings of the 30th International Conference on Information Modelling and Knowledge Bases, EJC 2020, Virtual Event / Hamburg, Germany, June 8-9, 2020. Volume 333 of Frontiers in Artificial Intelligence and Applications, pages 174-186, IOS Press, 2020. [doi]
Abstract is missing.