M. Streibl, F. Zängl, K. Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel. High abstraction level permutational ESD concept analysis. Microelectronics Reliability, 45(2):313-321, 2005. [doi]
@article{StreiblZESSGDS05,
title = {High abstraction level permutational ESD concept analysis},
author = {M. Streibl and F. Zängl and K. Esmark and Robert Schwencker and Wolfgang Stadler and Harald Gossner and S. Drüen and Doris Schmitt-Landsiedel},
year = {2005},
doi = {10.1016/j.microrel.2004.05.019},
url = {http://dx.doi.org/10.1016/j.microrel.2004.05.019},
tags = {analysis, abstraction},
researchr = {https://researchr.org/publication/StreiblZESSGDS05},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {2},
pages = {313-321},
}