Harald Gossner - researchr alias

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Viewing Publication 1 - 22 from 22

2025

System-Efficient ESD Design Based on a Modular Measurement System Applied to USBLucas Speckbacher, David Johannes Pommerenke, Gabriel Fellner, Lukas Pertoll, Harald Gossner. tim, 74:1-8, 2025. [doi]

2018

Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliabilityMilova Paul, B. Sampath Kumar, Harald Gossner, Mayank Shrivastava. irps 2018: 3 [doi]

2017

Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete?Milova Paul, Christian Russ, B. Sampath Kumar, Harald Gossner, Mayank Shrivastava. vlsid 2017: 391-394 [doi]

2016

A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA PackageAnkur Gupta, Mayank Shrivastava, Maryam Shojaei Baghini, Harald Gossner, V. Ramgopal Rao. vlsid 2016: 156-161 [doi]

2015

System efficient ESD designHarald Gossner, Charvaka Duvvury. mr, 55(12):2607-2613, 2015. [doi]

2012

Electronic design automation (EDA) solutions for ESD-robust design and verificationMichael G. Khazhinsky, Shuqing Cao, Harald Gossner, Gianluca Boselli, Melanie Etherton. cicc 2012: 1-8 [doi]

2010

System ESD robustness by co-design of on-chip and on-board protection measuresHarald Gossner, Werner Simbürger, M. Stecher. mr, 50(9-11):1359-1366, 2010. [doi]

2009

Reliability aspects of gate oxide under ESD pulse stressAdrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix. mr, 49(12):1407-1416, 2009. [doi]

Do ESD fails in systems correlate with IC ESD robustness?Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner. mr, 49(9-11):1079-1085, 2009. [doi]

2007

2006

Circuit design issues in multi-gate FET CMOS technologiesChristian Pacha, Klaus von Arnim, Thomas Schulz, Weize Xiong, M. Gostkowski, Gerhard Knoblinger, Andrew Marshall, T. Nirschl, J. Berthold, Christian Russ, Harald Gossner, Charvaka Duvvury, Paul Patruno, C. Rinn Cleavelin, Klaus Schruefer. isscc 2006: 1656-1665 [doi]

2005

High abstraction level permutational ESD concept analysisM. Streibl, F. Zängl, K. Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel. mr, 45(2):313-321, 2005. [doi]

A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and CircuitsHeinrich Wolf, Horst A. Gieser, Wolfgang Soldner, Harald Gossner. mr, 45(9-11):1421-1424, 2005. [doi]

2004

ESD protection for the deep sub micron regime - a challenge for design methodologyHarald Gossner. vlsid 2004: 809 [doi]

2003

Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologiesM. Streibl, K. Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner. mr, 43(7):1001-1010, 2003. [doi]

2002

Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection DevelopmentWolfgang Stadler, K. Esmark, Harald Gossner, M. Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, E. Gornik. mr, 42(9-11):1267-1274, 2002. [doi]

Case study of a technology transfer causing ESD problemsF. Zängl, Harald Gossner, K. Esmark, R. Owen, G. Zimmermann. mr, 42(9-11):1275-1280, 2002. [doi]

2001

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