Wolfgang Soldner, Martin Streibl, U. Hodel, Marc Tiebout, Harald Gossner, Doris Schmitt-Landsiedel, J. H. Chun, Choshu Ito, Robert W. Dutton. RF ESD protection strategies: Codesign vs. low-C protection. Microelectronics Reliability, 47(7):1008-1015, 2007. [doi]
Abstract is missing.