Wolfgang Soldner, Martin Streibl, U. Hodel, Marc Tiebout, Harald Gossner, Doris Schmitt-Landsiedel, J. H. Chun, Choshu Ito, Robert W. Dutton. RF ESD protection strategies: Codesign vs. low-C protection. Microelectronics Reliability, 47(7):1008-1015, 2007. [doi]
@article{SoldnerSHTGSCID07,
title = {RF ESD protection strategies: Codesign vs. low-C protection},
author = {Wolfgang Soldner and Martin Streibl and U. Hodel and Marc Tiebout and Harald Gossner and Doris Schmitt-Landsiedel and J. H. Chun and Choshu Ito and Robert W. Dutton},
year = {2007},
doi = {10.1016/j.microrel.2006.11.007},
url = {http://dx.doi.org/10.1016/j.microrel.2006.11.007},
tags = {C++},
researchr = {https://researchr.org/publication/SoldnerSHTGSCID07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {7},
pages = {1008-1015},
}