Hierarchical Test Generation with Built-In Fault Diagnosis

Dirk Stroobandt, Jan Van Campenhout. Hierarchical Test Generation with Built-In Fault Diagnosis. In 5th Asian Test Symposium (ATS 96), November 20-22, 1996, Hsinchu, Taiwan. pages 22-28, IEEE Computer Society, 1996. [doi]

Authors

Dirk Stroobandt

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Jan Van Campenhout

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