Design for Testability and Test Generation for Static Redundancy System Level Fault-Tolerant Circuits - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Charles E. Stroud, Ahmed E. Barbour. Design for Testability and Test Generation for Static Redundancy System Level Fault-Tolerant Circuits. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 812-818, IEEE Computer Society, 1989.

This author has not been identified. Look up 'Charles E. Stroud' in GoogleThis author has not been identified. Look up 'Ahmed E. Barbour' in Google

runs on WebDSL