Design for Testability and Test Generation for Static Redundancy System Level Fault-Tolerant Circuits - researchr publication

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Charles E. Stroud, Ahmed E. Barbour. Design for Testability and Test Generation for Static Redundancy System Level Fault-Tolerant Circuits. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 812-818, IEEE Computer Society, 1989.

Abstract is missing.

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