Charles E. Stroud, Ahmed E. Barbour. Testability and test generation for majority voting fault-tolerant circuits. J. Electronic Testing, 4(3):201-214, 1993. [doi]
@article{StroudB93,
title = {Testability and test generation for majority voting fault-tolerant circuits},
author = {Charles E. Stroud and Ahmed E. Barbour},
year = {1993},
doi = {10.1007/BF00971970},
url = {http://dx.doi.org/10.1007/BF00971970},
tags = {testing, e-science},
researchr = {https://researchr.org/publication/StroudB93},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {4},
number = {3},
pages = {201-214},
}