On-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices - researchr publication authors

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Charles E. Stroud, Srinivas M. Garimella, John Sunwoo. On-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices. In Gongzhu Hu, editor, 20th International Conference on Computers and Their Applications, CATA 2005, March 16-18, 2005, Holiday Inn Downtown-Superdome Hotel, New Orleans, Louisiana, USA, Proceedings. pages 308-313, ISCA, 2005.

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