Charles E. Stroud, Srinivas M. Garimella, John Sunwoo. On-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices. In Gongzhu Hu, editor, 20th International Conference on Computers and Their Applications, CATA 2005, March 16-18, 2005, Holiday Inn Downtown-Superdome Hotel, New Orleans, Louisiana, USA, Proceedings. pages 308-313, ISCA, 2005.
@inproceedings{StroudGS05,
title = {On-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices},
author = {Charles E. Stroud and Srinivas M. Garimella and John Sunwoo},
year = {2005},
tags = {rule-based, logic programming, e-science, logic},
researchr = {https://researchr.org/publication/StroudGS05},
cites = {0},
citedby = {0},
pages = {308-313},
booktitle = {20th International Conference on Computers and Their Applications, CATA 2005, March 16-18, 2005, Holiday Inn Downtown-Superdome Hotel, New Orleans, Louisiana, USA, Proceedings},
editor = {Gongzhu Hu},
publisher = {ISCA},
isbn = {1-880843-54-4},
}