Charles E. Stroud, Keshia N. Leach, Thomas A. Slaughter. BIST for Xilinx 4000 and Spartan Series FPGAs: A Case Study. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1258-1267, IEEE Computer Society, 2003. [doi]
@inproceedings{StroudLS03,
title = {BIST for Xilinx 4000 and Spartan Series FPGAs: A Case Study},
author = {Charles E. Stroud and Keshia N. Leach and Thomas A. Slaughter},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20631258abs.htm},
tags = {case study, e-science},
researchr = {https://researchr.org/publication/StroudLS03},
cites = {0},
citedby = {0},
pages = {1258-1267},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}