Built-In Self-Test for System-on-Chip: A Case Study

Charles E. Stroud, John Sunwoo, Srinivas M. Garimella, Jonathan Harris. Built-In Self-Test for System-on-Chip: A Case Study. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 837-846, IEEE, 2004. [doi]