Stefan Strüder, Mukelabai Mukelabai, Daniel Strüber 0001, Thorsten Berger. Feature-oriented defect prediction. In Roberto Erick Lopez-Herrejon, editor, SPLC '20: 24th ACM International Systems and Software Product Line Conference, Montreal, Quebec, Canada, October 19-23, 2020. ACM, 2020. [doi]
@inproceedings{StruderM0B20,
title = {Feature-oriented defect prediction},
author = {Stefan Strüder and Mukelabai Mukelabai and Daniel Strüber 0001 and Thorsten Berger},
year = {2020},
doi = {10.1145/3382025.3414960},
url = {https://doi.org/10.1145/3382025.3414960},
researchr = {https://researchr.org/publication/StruderM0B20},
cites = {0},
citedby = {0},
booktitle = {SPLC '20: 24th ACM International Systems and Software Product Line Conference, Montreal, Quebec, Canada, October 19-23, 2020},
editor = {Roberto Erick Lopez-Herrejon},
publisher = {ACM},
isbn = {978-1-4503-7569-6},
}