Stefan Strüder, Mukelabai Mukelabai, Daniel Strüber 0001, Thorsten Berger. Feature-oriented defect prediction. In Roberto Erick Lopez-Herrejon, editor, SPLC '20: 24th ACM International Systems and Software Product Line Conference, Montreal, Quebec, Canada, October 19-23, 2020. ACM, 2020. [doi]
Abstract is missing.