Machine Learning Approach in Mutation Testing

Joanna Strug, Barbara Strug. Machine Learning Approach in Mutation Testing. In Brian Nielsen, Carsten Weise, editors, Testing Software and Systems - 24th IFIP WG 6.1 International Conference, ICTSS 2012, Aalborg, Denmark, November 19-21, 2012. Proceedings. Volume 7641 of Lecture Notes in Computer Science, pages 200-214, Springer, 2012. [doi]

Abstract

Abstract is missing.