Peter F. Sturm, Amaël Delaunoy, Pau Gargallo, Emmanuel Prados, Kuk-Jin Yoon. 3D and Appearance Modeling from Images. In Eduardo Bayro-Corrochano, Jan-Olof Eklundh, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications, 14th Iberoamerican Conference on Pattern Recognition, CIARP 2009, Guadalajara, Jalisco, Mexico, November 15-18, 2009. Proceedings. Volume 5856 of Lecture Notes in Computer Science, pages 695-704, Springer, 2009. [doi]
Abstract is missing.