Chauchin Su, Yue-Tsang Chen. Crosstalk Effect Removal for Analog Measurement in Analog Test Bus. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 403-410, IEEE Computer Society, 2000. [doi]
@inproceedings{SuC00:0,
title = {Crosstalk Effect Removal for Analog Measurement in Analog Test Bus},
author = {Chauchin Su and Yue-Tsang Chen},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/vts/2000/0613/00/06130403abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/SuC00%3A0},
cites = {0},
citedby = {0},
pages = {403-410},
booktitle = {18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada},
publisher = {IEEE Computer Society},
isbn = {0-7695-0613-5},
}