The following publications are possibly variants of this publication:
- Parasitic Effect Removal for Analog Measurement in P1149.4 EnvironmentChauchin Su, Yue-Tsang Chen, Shyh-Jye Jou. itc 1997: 499-508
- Intrinsic response extraction for the removal of the parasiticeffects in analog test busesChauchin Su, Yue-Tsang Chen. tcad, 19(4):437-445, 2000. [doi]
- Intrinsic response for analog module testing using an analog testability busChauchin Su, Yue-Tsang Chen, Shyh-Jye Jou. todaes, 6(2):226-243, 2001. [doi]
- Metrology for analog module testing using analog testability busChauchin Su, Yue-Tsang Chen, Shyh-Jye Jou, Yuan-Tzu Ting. iccad 1996: 594-599 [doi]