Intrinsic response for analog module testing using an analog testability bus

Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou. Intrinsic response for analog module testing using an analog testability bus. ACM Trans. Design Autom. Electr. Syst., 6(2):226-243, 2001. [doi]

Abstract

Abstract is missing.