Chauchin Su, Yue-Tsang Chen. Intrinsic response extraction for the removal of the parasiticeffects in analog test buses. IEEE Trans. on CAD of Integrated Circuits and Systems, 19(4):437-445, 2000. [doi]
@article{SuC00:1,
title = {Intrinsic response extraction for the removal of the parasiticeffects in analog test buses},
author = {Chauchin Su and Yue-Tsang Chen},
year = {2000},
doi = {10.1109/43.838993},
url = {http://doi.ieeecomputersociety.org/10.1109/43.838993},
tags = {testing},
researchr = {https://researchr.org/publication/SuC00%3A1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {19},
number = {4},
pages = {437-445},
}