Fei Su, Krishnendu Chakrabarty. Defect Tolerance for Gracefully-Degradable Microfluidics-Based Biochips. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 321-326, IEEE Computer Society, 2005. [doi]
@inproceedings{SuC05:2,
title = {Defect Tolerance for Gracefully-Degradable Microfluidics-Based Biochips},
author = {Fei Su and Krishnendu Chakrabarty},
year = {2005},
doi = {10.1109/VTS.2005.39},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.39},
tags = {rule-based},
researchr = {https://researchr.org/publication/SuC05%3A2},
cites = {0},
citedby = {0},
pages = {321-326},
booktitle = {23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2314-5},
}