Impulse Response Fault Model and Fault Extraction for Functional Level Analog Circuit Diagnosis

Chauchin Su, Yue-Tsang Chen, Shenshung Chiang. Impulse Response Fault Model and Fault Extraction for Functional Level Analog Circuit Diagnosis. J. Inf. Sci. Eng., 16(5):767-781, 2000. [doi]

Abstract

Abstract is missing.