Jianwei Su, Jiancheng Li, Jianfei Wu, Chunming Wang. Investigation of Reproducibility and Repeatability Issue on EFT Test at IC Level to Microcontrollers. In Weixia Xu, Liquan Xiao, Chengyi Zhang, Jinwen Li, Liyan Yu, editors, Computer Engineering and Technology - 17th CCF Conference, NCCET 2013, Xining, China, July 20-22, 2013. Revised Selected Papers. Volume 396 of Communications in Computer and Information Science, pages 171-179, Springer, 2013. [doi]
Abstract is missing.