Innovation Practices Track: VLSI Functional Safety

Fei Su, Meirav Nitzan, Ankush Sethi, Vaibhav Kumar, Dan Alexandrescu. Innovation Practices Track: VLSI Functional Safety. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1, IEEE, 2023. [doi]

Authors

Fei Su

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Meirav Nitzan

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Ankush Sethi

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Vaibhav Kumar

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Dan Alexandrescu

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