Light degradation test and design of thermal performance for high-power light-emitting diodes

Yen-Fu Su, Shin-Yueh Yang, Tuan-Yu Hung, Chang-Chun Lee, Kuo-Ning Chiang. Light degradation test and design of thermal performance for high-power light-emitting diodes. Microelectronics Reliability, 52(5):794-803, 2012. [doi]

Abstract

Abstract is missing.