Few-shot defect recognition for the multi-domain industry via attention embedding and fine-grained feature enhancement

Yingtao Su, Ping Yan, Junyao Lin, Chao Wen, Yong Fan. Few-shot defect recognition for the multi-domain industry via attention embedding and fine-grained feature enhancement. Knowl.-Based Syst., 284:111265, 2024. [doi]

Abstract

Abstract is missing.