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Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound

Lei Su, Xiaonan Yu, Ke Li, Xingyan Yao, Michael Pecht. Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound. IEEE Access, 7:11515-11525, 2019. [doi]

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Lei Su

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Xiaonan Yu

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Ke Li

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Xingyan Yao

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Michael Pecht

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