Lei Su, Xiaonan Yu, Ke Li, Xingyan Yao, Michael Pecht. Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound. IEEE Access, 7:11515-11525, 2019. [doi]
@article{SuYLYP19,
title = {Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound},
author = {Lei Su and Xiaonan Yu and Ke Li and Xingyan Yao and Michael Pecht},
year = {2019},
doi = {10.1109/ACCESS.2019.2892231},
url = {https://doi.org/10.1109/ACCESS.2019.2892231},
researchr = {https://researchr.org/publication/SuYLYP19},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {7},
pages = {11515-11525},
}