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Improving test-retest reliability of quantitative electroencephalography using different preprocessing approaches

Jazmin Suarez-Revelo, John Ochoa-Gomez, Jon Duque-Grajales. Improving test-retest reliability of quantitative electroencephalography using different preprocessing approaches. In 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016, Orlando, FL, USA, August 16-20, 2016. pages 961-964, IEEE, 2016. [doi]

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Jazmin Suarez-Revelo

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John Ochoa-Gomez

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Jon Duque-Grajales

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