Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping

Siva Sudani, Li Xu, Degang Chen. Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-10, IEEE Computer Society, 2013. [doi]

Authors

Siva Sudani

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Li Xu

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Degang Chen

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