Understanding rare safety and reliability events using forward-flux sampling

Vikram Sudarshan, Warren D. Seider, Amish J. Patel, Jeffery E. Arbogast. Understanding rare safety and reliability events using forward-flux sampling. Computers & Chemical Engineering, 153:107387, 2021. [doi]

Authors

Vikram Sudarshan

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Warren D. Seider

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Amish J. Patel

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Jeffery E. Arbogast

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