Vikram Sudarshan, Warren D. Seider, Amish J. Patel, Jeffery E. Arbogast. Understanding rare safety and reliability events using forward-flux sampling. Computers & Chemical Engineering, 153:107387, 2021. [doi]
@article{SudarshanSPA21,
title = {Understanding rare safety and reliability events using forward-flux sampling},
author = {Vikram Sudarshan and Warren D. Seider and Amish J. Patel and Jeffery E. Arbogast},
year = {2021},
doi = {10.1016/j.compchemeng.2021.107387},
url = {https://doi.org/10.1016/j.compchemeng.2021.107387},
researchr = {https://researchr.org/publication/SudarshanSPA21},
cites = {0},
citedby = {0},
journal = {Computers & Chemical Engineering},
volume = {153},
pages = {107387},
}